Volume 32, Issue 2 (Dec 2013)                   jame 2013, 32(2): 89-100 | Back to browse issues page

XML Persian Abstract Print

Department of Materials Engineering, Bu-Ali Sina University
Abstract:   (1524 Views)
In this study, effect of potential on composition and depth profiles of passive films formed on 316L stainless steel in 0.05 M sulfuric acid has been examined using X-ray photoelectron spectroscopy (XPS). For passive film formation within the passive region, four potentials -0.2, 0.2, 0.5, and 0.8 VSCE were chosen and films were gown at each potential for 60 min. XPS analysis results showed that atomic concentration of Cr and Fe initially increase (E < 0.5 VSCE) and then decrease with potential. This decrease is due to surface dissolution of the Fe and Cr oxides. For both alloying elements, Ni and Mo, no obvious change in atomic concentration was showed. Results indicated that at higher potentials, before entering transpassive region, oxidation of Cr3+ to Cr6+ is happened.
Full-Text [PDF 278 kb]   (391 Downloads)    
Type of Study: Research | Subject: General
Received: 2015/02/9 | Accepted: 2015/05/6 | Published: 2015/05/6