بررسی تغییرات ساختاری گرافیت تحت تابش پالس‌های یونی: مطالعه موردی بر روی مواد مواجه با پلاسما

نوع مقاله : مقاله پژوهشی

نویسندگان

پژوهشکده پلاسما و گداخت هسته‌ای، پژوهشگاه علوم و فنون هسته‌ای، سازمان انرژی اتمی ایران، تهران، ایران

چکیده

در این تحقیق اثرات تابش یون‌های پر انرژی هیدروژن تولید شده در دستگاه پلاسمای کانونی نوع مدرن MTPF-2 بر روی خواص سطحی و ساختاری گرافیت بررسی شد. از پروتون‌های پر انرژی تولید شده در دستگاه پلاسمای کانونی برای تابش‌دهی نمونه‌های گرافیت در تخلیه‌های مختلف استفاده گردید. تغییرات ناشی از تابش در سطح گرافیت با استفاده از میکروسکوپ نوری و میکروسکوپ الکترونی مورد بررسی قرار گرفت. تغیرات ایجاد شده در سطح نمونه‌های تحت تابش قرار گرفته به وضوح در تصاویر میکروسکوپ الکترونی روبشی دیده ‌شد. تصاویر میکروسکوپی نمونه‌های تابش‌دهی شده کندوپاش‌های نقطه همچنین خلل و فرج در سطح نمونه‌های به همراه ذوب‌شدگی نقطه که وابسته به فلوئنس یونی (تعداد تخلیه الکتریکی) می‌باشد را نشان داد. از آنالیز پراش پرتو ایکس برای بررسی تغییرات ایجاد شده در ساختار گرافیت در اثر تابش پروتون‌های پرانرژی استفاده شد. در طیف پراش پرتو ایکس نمونه‌های تابش‌دهی شده جابجایی در مکان قلّه‌ها، تغییر شدت قلّه‌ها و افزایش اندازه کریستال در نمونه‌های تابش‌دهی شده نسبت به طیف پراش پرتو ایکس نمونه مرجع مشاهده شد. همچنین از آشکارساز فنجان فارادی برای مشخصه‌یابی طیف یونی هیدروژن ایجاد شده در دستگاه پلاسمای کانونی استفاده شد. نتایج نشان داد که انرژی میانگین یون‌های تولید شده حدود  keV46 است.

کلیدواژه‌ها

موضوعات

عنوان مقاله [English]

Evaluating Structural Changes in Graphite Under Ion Pulse Irradiation: A Case Study on Plasma Facing Materials

نویسندگان [English]

  • M.M.R. Seyed Habashy
  • A.R. Asle Zaeem
Plasma and Nuclear Fusion Research Institute, Nuclear Science and Technology Research Institute, Atomic Energy Organization of Iran, Tehran, Iran
چکیده [English]

In this study, the effects of high-energy hydrogen ion irradiation, generated by the MTPF-2 type modern plasma focus device, on the surface and structural properties of graphite were investigated. High-energy protons produced by the plasma focus device were used to irradiate graphite samples in various shots. The radiation-induced changes on the graphite surface were examined using optical microscope and scanning electron microscopy. The modifications on the irradiated samples' surface were clearly observed in the scanning electron microscopyand optical microscope images. The microscopic images of the irradiated samples revealed point sputtering as well as pores on the sample surface, along with point melting, which are dependent on the ion fluence (number of shots). X-ray diffraction analysis was employed to study the structural changes in the graphite caused by the high-energy proton irradiation. The X-ray diffraction spectra of the irradiated samples showed shifts in the peak positions, changes in the peak intensities, and an increase in the crystallite size compared to the X-ray diffractionspectra of the reference sample. Additionally, a Faraday cup detector was used to characterize the hydrogen ion spectrum produced in the plasma focus device. The results indicated that the average energy of the generated ions was ~ 46 keV.

کلیدواژه‌ها [English]

  • Plasma-Exposed Materials
  • Plasma Focus Device
  • Graphite
  • Radiation Damage
  • Tokamak

مراجع

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مواد پیشرفته در مهندسی
دوره 43، شماره 3
مهر 1403
صفحه 65-83

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